FOCUS FE VII
Category
EllipsometryOverview
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
Active Listings
16
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Inspection, Insurance, Appraisal, Logistics
ONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast Verified4 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 30 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: 2002Condition: UsedLast VerifiedOver 60 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 60 days ago
ONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 60 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 60 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 60 days agoONTO / RUDOLPH / AUGUST
FOCUS FE VII
EllipsometryVintage: Condition: UsedLast VerifiedOver 60 days ago