Description
Teradyne J750-94 Calibration Status: DPS_DIB and AC Calibration – PASSEDConfiguration
512 Channel • LVM 16 M • DPS 4 pcs • MTO 2 pcs • Configured for prober docking #slot[.subslot] Type -1 sli 0 channel 0512-B 5445 1 channel 0951-B 5445 2 channel 0951-E 5445 3 channel 0951-B 5445 4 channel 0826-5 5445 5 channel 0621-B 5445 6 channel 0951-B 5445 7 channel 0621-B 5445 18 cub 0424-D 5445 21 dps 0101-D 5445 22 dps 1232-D 5445 23 dps 0101-D 5445 24 dps c002456 0512-E 5445 Software Version: 7.60.42OEM Model Description
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.Documents
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TERADYNE
J750
CATEGORY
Final Test
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
128734
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available