Description

No description

Configuration

Temperature: Chuck support cold, RT and hot temperature. But exclude chiller Include cleaning unit. But no probe card autoloader

OEM Model Description

The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.

Documents

UF3000Ex.mov

ACCRETECH / TSK

UF3000EX-e

Verified

Probers

Last Verified: Over 30 days ago

Key Item Details

Condition:

Used

Operational Status:

Deinstalled

Product ID:

126470

Wafer Sizes:

Unknown

Vintage:

2012

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

Similar Listings