Description
Scanning Electron Microscope (SEM)Configuration
Pump and chiller Known issues: Turbopump requires replacement High stability Schottky field emission gun; Fast chamber evacuation: 2 min; 0.2 to 30 kV; Beam deceleration with stage bias from -150 V to -4 kV; Lowest landing energy 50 V; Optimal high vacuum image resolution: 1.6 nm at 1 kV; 1.0 nm at 15 kV; High vacuum SED, in-lens (TLD), EDX, vCD (high sensitivity low kV BSE) detectors; Optimal low vacuum image resolution: 2.0 nm; Low vacuum LVD, LVD/Helix, GAD (TV-rate solid-state BSE), EDX, vCD (high sensitivity low kV BSE) detectors; 5-axes motorized stage; z axis movable up to 60 mm; -5°/+70° tiltOEM Model Description
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CATEGORY
SEM / FIB
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153433
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
NOVA NANOSEM 430
CATEGORY
SEM / FIB
Last Verified: 12 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
153433
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Scanning Electron Microscope (SEM)Configuration
Pump and chiller Known issues: Turbopump requires replacement High stability Schottky field emission gun; Fast chamber evacuation: 2 min; 0.2 to 30 kV; Beam deceleration with stage bias from -150 V to -4 kV; Lowest landing energy 50 V; Optimal high vacuum image resolution: 1.6 nm at 1 kV; 1.0 nm at 15 kV; High vacuum SED, in-lens (TLD), EDX, vCD (high sensitivity low kV BSE) detectors; Optimal low vacuum image resolution: 2.0 nm; Low vacuum LVD, LVD/Helix, GAD (TV-rate solid-state BSE), EDX, vCD (high sensitivity low kV BSE) detectors; 5-axes motorized stage; z axis movable up to 60 mm; -5°/+70° tiltOEM Model Description
None ProvidedDocuments
No documents