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ACCRETECH / TSK UF3000EX-e
    Description
    No description
    Configuration
    OCR: Yes Wafer specification Size: 8"/12" Thickness: 240~2200um Die size: 350~76000um Autoloader unit 300 mm FOUP/ FOSB and 200 mm cassette Interface Single port Loader GPIB Chuck Nickel plate Planarity: 15um (20°C≤t ≤50°C) 30um (50°C≤t ≤200°C) Temperature: 30°C to 150°C Withstand Load : 200kgf Display Unit: 15" color display & touch panel Cleaning Unit (100 mm x 60mm) 3 block with vacuum type APC function No Miscellaneous 1. Touch sensor. 2. Ethernet interface. 3. Cognex 8200 Auto hinge No Probe card holder No Touch sensor Yes
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents
    verified-listing-icon

    Verified

    CATEGORY
    Probers

    Last Verified: 3 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    128849


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    Probers
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago
    PREFERRED
     
    SELLER
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    Probers
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    ACCRETECH / TSK

    UF3000EX-e

    verified-listing-icon
    Verified
    CATEGORY
    Probers
    Last Verified: 3 days ago
    listing-photo-0fcd5245214f4d5a90d58e03739757eb-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    128849


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    OCR: Yes Wafer specification Size: 8"/12" Thickness: 240~2200um Die size: 350~76000um Autoloader unit 300 mm FOUP/ FOSB and 200 mm cassette Interface Single port Loader GPIB Chuck Nickel plate Planarity: 15um (20°C≤t ≤50°C) 30um (50°C≤t ≤200°C) Temperature: 30°C to 150°C Withstand Load : 200kgf Display Unit: 15" color display & touch panel Cleaning Unit (100 mm x 60mm) 3 block with vacuum type APC function No Miscellaneous 1. Touch sensor. 2. Ethernet interface. 3. Cognex 8200 Auto hinge No Probe card holder No Touch sensor Yes
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents
    Similar Listings
    View All
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    ProbersVintage: 0Condition: UsedLast Verified:Over 60 days ago
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    ProbersVintage: 2012Condition: UsedLast Verified:Over 60 days ago
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    ProbersVintage: 2017Condition: UsedLast Verified:Over 30 days ago